The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics.
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The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics.
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Add this copy of Advances in X-Ray Analysis: Volume 28 to cart. $51.65, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2011 by Springer.
Add this copy of Advances in X-Ray Analysis: Volume 28 to cart. $81.67, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2011 by Springer.
