This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework. Read More
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework. Read Less
Add this copy of High Quality Test Pattern Generation and Boolean S to cart. $81.06, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2012 by Springer.
Add this copy of High Quality Test Pattern Generation and Boolean S to cart. $82.82, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2014 by Springer.
Add this copy of High Quality Test Pattern Generation and Boolean S to cart. $87.80, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2012 by Springer.
Add this copy of High Quality Test Pattern Generation and Boolean S to cart. $89.76, new condition, Sold by Educational Media Centre rated 4.0 out of 5 stars, ships from New Delhi, DELHI, INDIA, published 2014 by Springer.
Add this copy of High Quality Test Pattern Generation and Boolean S to cart. $98.99, new condition, Sold by Basi6 International rated 5.0 out of 5 stars, ships from Irving, TX, UNITED STATES, published 2012 by Springer.
