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ISBN: 9780123705976
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0123705975 /
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Vlsi Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Wu, Cheng-Wen|Abdel-Hafez, Khader S. |Wang, Laung-Terng|Jone, Wen-Ben|Kapur, Rohit|Wen, Xiaoqing|Keller, Brion|Lee, Kuen-Jong...
2006, Morgan Kaufmann
ISBN-13:
9780123705976
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Edition: 2006, Morgan Kaufmann
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Details: ISBN:
0123705975
ISBN-13:
9780123705976
Publisher:
Morgan Kaufmann
Published:
2006
Language:
English
Alibris ID:
18853626385
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Vlsi Test Principles and Architectures: Design for Testability 1ed
2006, Morgan Kaufmann Publishers
ISBN-13:
9780123705976
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Edition: 2006, Morgan Kaufmann Publishers
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Available Copies: 10
Details: ISBN:
0123705975
ISBN-13:
9780123705976
Publisher:
Morgan Kaufmann Publishers
Published:
2006
Language:
English
Alibris ID:
18980174771
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Vlsi Test Principles and Architectures: Design for Testability 1ed
2006, Morgan Kaufmann Publishers
ISBN-13:
9780123705976
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Edition: 2006, Morgan Kaufmann Publishers
New
Available Copies: 10
Details: ISBN:
0123705975
ISBN-13:
9780123705976
Publisher:
Morgan Kaufmann Publishers
Published:
2006
Language:
English
Alibris ID:
18976811832
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