9780792381075

Educational Media Centre

New Delhi, DELHI, INDIA

$121.32 $169.99

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	Edition: 1998, Springer New Available Copies: 10	Details: ISBN: 0792381076 ISBN-13: 9780792381075 Edition: 1998 edition Publisher: Springer Published: 1998 Language: English Alibris ID: 18980158872	Shipping Options: Standard Shipping: $4.99 Choose your shipping method in Checkout. Costs may vary based on destination.
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Reliability, Yield, and Stress Burn-in

1998, Springer

ISBN-13: 9780792381075

Basi6 International

Irving, TX, USA

$128.56 $169.99

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	Edition: 1998, Springer New Available Copies: 10	Details: ISBN: 0792381076 ISBN-13: 9780792381075 Edition: 1998 edition Publisher: Springer Published: 1998 Language: English Alibris ID: 18976852241	Shipping Options: Standard Shipping: $4.99 Choose your shipping method in Checkout. Costs may vary based on destination.
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Reliability, Yield, and Stress Burn-in

1998, Springer

ISBN-13: 9780792381075

Educational Media Centre

New Delhi, DELHI, INDIA

$137.11 $169.99

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	Edition: 1998, Springer New	Details: ISBN: 0792381076 ISBN-13: 9780792381075 Edition: 1998 edition Publisher: Springer Published: 1998 Language: English Alibris ID: 18965818931	Shipping Options: Standard Shipping: $4.99 Choose your shipping method in Checkout. Costs may vary based on destination.
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Hardcover, New

Reliability, Yield, and Stress Burn-in: a Unified Approach for Microelectronics Systems Manufacturing & Software Development

by Way Kuo; Wei-Ting Kary Chien; Taeho Kim

1998, Springer

ISBN-13: 9780792381075

GridFreed

San Diego, CA, USA

$150.27 $169.99

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	Edition: 1998, Springer Hardcover, New	Details: ISBN: 0792381076 ISBN-13: 9780792381075 Edition: 1998 edition Publisher: Springer Published: 01/1998 Language: English Alibris ID: 18931428458	Shipping Options: Standard Shipping: $4.99 Choose your shipping method in Checkout. Costs may vary based on destination.
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Hardcover, New

Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

by Way Kuo, and Wei-Ting Kary Chien, and Taeho Kim

1998, Springer

ISBN-13: 9780792381075

Alibris

NV, USA

$159.69

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	Edition: 1998, Springer Hardcover, New Available Copies: 10+	Details: ISBN: 0792381076 ISBN-13: 9780792381075 Edition: 1998 edition Publisher: Springer Published: 1998 Language: English Alibris ID: 10104430326	Shipping Options: Standard Shipping: $4.99 Trackable Expedited: $9.99 Two Day Air: $29.99 Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Print on demand Sewn binding. Cloth over boards. 394 p. Contains: Unspecified.
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Hardcover, New

Reliability, Yield, and Stress Burn-in: a Unified Approach for Microelectronics Systems Manufacturing & Software Development

by Way Kuo

1998, Springer

ISBN-13: 9780792381075

Just one more Chapter

Miramar, FL, USA

$189.04

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	Edition: 1998, Springer Hardcover, New	Details: ISBN: 0792381076 ISBN-13: 9780792381075 Edition: 1998 edition Publisher: Springer Published: 1998 Language: English Alibris ID: 19003893962	Shipping Options: Standard Shipping: $4.99 Choose your shipping method in Checkout. Costs may vary based on destination.
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Hardcover, Good

Reliability, Yield, and Stress Burn-in: a Unified Approach for Microelectronics Systems Manufacturing & Software Development

by Way Kuo

1998, Springer

ISBN-13: 9780792381075

Bonita

Santa Clarita, CA, USA

$194.34

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	Edition: 1998, Springer Hardcover, Good	Details: ISBN: 0792381076 ISBN-13: 9780792381075 Edition: 1998 edition Publisher: Springer Published: 1998 Language: English Alibris ID: 19003921186	Shipping Options: Standard Shipping: $4.99 Trackable Expedited: $9.99 Choose your shipping method in Checkout. Costs may vary based on destination.
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Hardcover, New

Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

by Way Kuo, and Wei-Ting Kary Chien, and Taeho Kim

1998, Springer

ISBN-13: 9780792381075

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