Add this copy of 1997 Ieee International Symposium on Defect and Fault to cart. $116.01, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1997 by IEEE Computer Society.
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Seller's Description:
Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Add this copy of 1997 Ieee International Symposium on Defect and Fault to cart. $316.86, very good condition, Sold by Alien Bindings rated 4.0 out of 5 stars, ships from BALTIMORE, MD, UNITED STATES, published 1997 by Institute of Electrical & Electronics Engineers.
Edition:
1997, Institute of Electrical & Electronics Engineers
Publisher:
Institute of Electrical & Electronics Engineers
Published:
1997
Language:
English
Alibris ID:
16749634324
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Seller's Description:
Very good. Ex research library book. The covers look great. The binding is tight. The interior pages are clean and unmarked. Electronic delivery tracking will be issued free of charge. 314 pages.
