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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
by Reimer, Ludwig
1998, Springer
ISBN-13:
9783540639763
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3540639764
ISBN-13:
9783540639763
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2nd Compl Rev & Updtd edition
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Springer
Published:
1998
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English
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18690106691
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
by Reimer, Ludwig
1998, Springer
ISBN-13:
9783540639763
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Edition: 1998, Springer
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Details: ISBN:
3540639764
ISBN-13:
9783540639763
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2nd Compl Rev & Updtd edition
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Springer
Published:
1998
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Scanning Electron Microscopy
1998, Springer
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Edition: 1998, Springer
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Details: ISBN:
3540639764
ISBN-13:
9783540639763
Edition:
2nd Compl Rev & Updtd edition
Publisher:
Springer
Published:
1998
Language:
English
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18979785596
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Scanning Electron Microscopy
1998, Springer
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Edition: 1998, Springer
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Details: ISBN:
3540639764
ISBN-13:
9783540639763
Edition:
2nd Compl Rev & Updtd edition
Publisher:
Springer
Published:
1998
Language:
English
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18976491080
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Scanning Electron Microscopy
1998, Springer
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3540639764
ISBN-13:
9783540639763
Edition:
2nd Compl Rev & Updtd edition
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Springer
Published:
1998
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18965422614
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Scanning Electron Microscopy
1998, Springer
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9783540639763
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3540639764
ISBN-13:
9783540639763
Edition:
2nd Compl Rev & Updtd edition
Publisher:
Springer
Published:
1998
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English
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18951980249
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
by Reimer, Ludwig; Hawkes, P.W. [Editor]
1998, Springer
ISBN-13:
9783540639763
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Edition: 1998, Springer
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Details: ISBN:
3540639764
ISBN-13:
9783540639763
Edition:
2nd Compl Rev & Updtd edition
Publisher:
Springer
Published:
09/1998
Language:
English
Alibris ID:
18939708979
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