Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $122.41, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 2009 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $122.43, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 2009 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This Hugely Successful and Highly Acclaimed Text is Designed to Meet the Needs of Materials Scientists at All Levels...
Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $136.10, very good condition, Sold by LLU- BOOKSERVICE ANTIQUARIAN rated 3.0 out of 5 stars, ships from Wahlstedt, S-H, GERMANY, published 2007 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Very good. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Add this copy of Transmission Electron Microscopy & Diffractometry of to cart. $259.95, new condition, Sold by textsforsale rated 4.0 out of 5 stars, ships from Houston, TX, UNITED STATES, published 2007 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out by Amazon directly with free tracking.